At Cadence, we hire and develop leaders and innovators who want to make an impact on the world of technology.
We are looking for SoC/ASIC Digital Design Engineer with experience in Design for Test (DFT). An intimate knowledge and experience in scan chain insertion, compression scan technologies, memory built-in self-test (MBIST) and automatic test pattern generation (ATPG) is required for this position. Should follow systematic quality metrics driven ATPG pattern generation. It is highly desirable for candidate to possess hands-on knowledge of synthesis, verification and debugging Verilog testbenches.
Requirements;
US citizenship preferred.
Prior 3-12 years of professional experience in SoC/ASIC Digital Design with focus on Design for Test (DFT)
Should possess intimate knowledge of DFT insertion flows
Basic scan chain insertion using synthesis or other software tools
Experience in compression scan insertion, LBIST and other scan technologies
Intimate knowledge of memory build-in self-test (MBIST)
Expertise in Automatic Test Pattern Generation (ATPG) to achieve design test coverage goals
Debug and Analysis of failures to improve fault coverage
Verification of ATPG testbenches and debugging root cause of simulation mis-compares
Working knowledge of JTAG 1149.1/6, IEEE1500 and IEEE1687
Knowledge of timing analysis and equivalency checks would be added bonus
Ability to work in collaborative team environment
Prior experience with Cadence tools and flows is highly desirable
Should be able to finish DFT tasks independently
Strong problem-solving skills. Exhibit discipline, thoroughness, and methodical approach in solving problems
Ability to work with stakeholders across cross-functional teams - Architecture, Design, Internal and External Customers
Self-driven and committed individual who can work in a fast-paced project environment
We're doing work that matters. Help us solve what others can't.
Numbers & Facts
Location
San Jose, CA
Skills
ASIC Designunmatched
Architectural Designunmatched
Automatic Test Pattern Generation (ATPG)unmatched
Boundary Scanunmatched
Cadenceunmatched
Cross-Functionalunmatched
DFT (Design for Test)unmatched
Debugging Skillsunmatched
Failure Analysisunmatched
Graphic Designunmatched
IEEE (Institute of Electrical and Electronic Engineers)unmatched
Management of Information Systems/Technology (MIS)unmatched
Memory Hardwareunmatched
Problem Solving Skillsunmatched
Quality Metricsunmatched
Simulationunmatched
System-on-a-Chip (SoC)unmatched
Team Playerunmatched
Technical/Engineering Designunmatched
Test Designunmatched
Testingunmatched
Timing Verificationunmatched
United States Citizenunmatched
Verilog Hardware Description Languageunmatched
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