Technical Associate - Research & Development
Duration: 12 months W2 Contract + Annual Renewal Work Arrangement: 100% Onsite Location: Wilmington, DE Schedule: Monday-Friday | 4:00 PM - 12:30 AM (Second Shift) Compensation: $31.69/hr
Job Description:
The candidate will assume responsibility for the second-shift operation of a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) within an advanced analytical sciences laboratory.
This onsite position is located in Wilmington, DE and will work under the direction of experienced scientists to provide analytical support for Research & Development (R&D), Technical Service & Development (TS&D), and Manufacturing organizations.
The role involves operating sophisticated microscopy equipment, preparing samples for analysis, performing materials characterization, and supporting critical research and manufacturing initiatives.
Key responsibilities:
Prepare samples for analysis, following established procedures using equipment such as mechanical polishers, plasma or sputter coaters, and FIB-SEM cross-section milling and lift-out procedures.
Perform FIB-SEM analyses including imaging, energy-dispersive x-ray spectroscopy (EDS), and electron backscattered diffraction (EBSD), and assess basic data quality.
Review and organize collected data for reporting to customers.
Perform routine instrument maintenance, following established procedures.
Dispose of laboratory waste according to established protocols.
Work second-shift hours and coordinate work with first-shift FIB-SEM operator.
Adhere to all safety protocols.
Required Qualifications:
Bachelor's Degree in Chemistry, Materials Science, Physics, Engineering, or related scientific discipline
Laboratory experience in an academic, research, or industrial setting
Experience handling chemicals in a laboratory environment
Strong understanding of laboratory safety procedures
Ability to work under tight timelines and competing priorities
Strong communication and teamwork skills
Preferred Qualifications:
Electron Microscopy experience
FIB-SEM (Focused Ion Beam Scanning Electron Microscopy) experience