Experience working with a wide variety of scientific and engineering analysis tools used in optoelectronic thin-film device optimization (SEM, TEM, Powder XRD, GIWAX, AFM, XPS, PLQE, TRPL, UV-Vis, Fluorescence, Bright and Dark Field Microscopy, and a variety of electrical measurements). Prototype, test, and optimize semiconductor device architectures; semiconductor, metallic and dielectric thin-film materials, leveraging your expertise in thin-film, with a focus on Perovskites and OPVs and relevant additional materials systems.