Performs fault isolation and failure analysis to determine the root cause of failures by evaluating the electrical characteristics of the components using various tools and techniques such as ATE testing, DFx software tools, optical probing, logic/circuit simulation, and emulation, probing, and layout study. Develops methods, processes, and systems to consolidate and analyze diverse big data sources, establishing optimal methodologies for defect mode understanding and yield modeling, leading to accurate yield Pareto construction and process roadmap definition.