Mountain View, CA15 days ago
Execute Application-Specific Integrated Circuit (ASIC) product reliability qualification tests, including High Temperature Operating Life (HTOL), Electrostatic Discharge (ESD), Latch-Up (LU), Early Life Failure Rate (ELFR), Temperature Cycling (TC), and Biased Highly Accelerated Stress Test (BHAST) testing. 6 years of experience in logic Application-Specific Integrated Circuit (ASIC) device and package reliability Joint Electron Device Engineering Council (JEDEC) qualification, including High Temperature Operating Life (HTOL), Electrostatic Discharge (ESD), Latch-Up (LU), Temperature Cycling (TC), and Highly Accelerated Stress Test (HAST).