Develop production, qualification and characterization test programs for WLAN, BT, and UWB system on a chip (SOC) devices on ATE (Automatic Test Equipment)
Advantest 93K/Exascale, Teradyne UFLEX/UFLEX+ ATE experience preferred
Test development from design kick-off to production release
Debug design and process related yield and performance problems
Develop new DFT (Design for Test) concepts and
test techniques to improve test efficiency and reduce cost of test
Collaborate closely with Design, Systems, and Software teams to drive innovative new RF/analog test methods and accompanying device design implementation (Built in self-test, firmware-based testing, etc.)
Work across product lines and other teams to drive new DFT and Test Engineering approaches within the group and across the company.
Job Requirements:
Masters or Bachelor of Science degree in Computer or Electrical Engineering with 10+ years of experience
Strong communication and problem solving skills
Self-driven, able to take ownership and initiative of all project aspects while working independently and with the entire team
More information about NXP in the United States...
NXP is an Equal Opportunity/Affirmative Action Employer regardless of age, color, national origin, race, religion, creed, gender, sex, sexual orientation, gender identity and/or expression, marital status, status as a disabled veteran and/or veteran of the Vietnam Era or any other characteristic protected by federal, state or local law. In addition, NXP will provide reasonable accommodations for otherwise qualified disabled individuals.
#LI-6692
Numbers & Facts
Location
Chandler, AZ
Skills
ATE Testersunmatched
C++ Programming Languageunmatched
Communication Skillsunmatched
Computer Engineeringunmatched
Computer Firmwareunmatched
Computer Programmingunmatched
Computer Scienceunmatched
Cost Controlunmatched
DFT (Design for Test)unmatched
Debugging Skillsunmatched
Electrical Engineeringunmatched
English Languageunmatched
Javaunmatched
Microsoft Visual Basicunmatched
Mixed Signal RFunmatched
Problem Solving Skillsunmatched
Quality Assurance Methodologyunmatched
Radio Frequencyunmatched
System-on-a-Chip (SoC)unmatched
Test Equipmentunmatched
Test Plan/Scheduleunmatched
Test Programunmatched
Testingunmatched
Wireless LANunmatched
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