Staff R&D Scientist

Onto Innovation is a leader in process control, combining global scale with an expanded portfolio of leading-edge technologies that include: 3D metrology spanning the chip from nanometer-scale transistors to micron-level die-interconnects; macro defect inspection of wafers and packages; metal interconnect composition; factory analytics; and lithography for advanced semiconductor packaging. Our breadth of offerings across the entire semiconductor value chain helps our customers solve their most difficult yield, device performance, quality, and reliability issues. Onto Innovation strives to optimize customers' critical path of progress by making them smarter, faster and more efficient.

Job Summary & Responsibilities

Position Summary

The Staff / Senior R&D Scientist will join our advanced metrology and analytics research team operating across Singapore and the USA. The highly self-motivated individual will play an active, hands-on role in developing data analytics and modeling solutions for X-ray metrology. The role will focus on designing and creating innovative algorithms, physics-based modeling, machine learning approaches, and data fusion methodologies that enable accurate and robust characterization of advanced semiconductor microelectronics. The scientist will collaborate closely with R&D and application scientists, software engineering, and product/program management to innovate, prototype, validate, implement, and test differentiated metrology solutions for next-generation semiconductor manufacturing.

Roles and Responsibilities

• Interface with application scientists, product/program management, and marketing team to understand and analyze customers' requirements and technology gaps.
• Innovate and develop new concepts to address customer challenges and close identified technology gaps, working both independently and within cross‑functional teams.
• Collect and analyze technical data, conduct literature reviews, propose new methodologies or improvements to existing solutions.
• Conceptualize, design, prototype, and fine-tune algorithms and find the best approach to solve a specific problem.
• Develop advanced algorithms for X-ray metrology (CD-SAXS, XRD, XRR etc.) data analysis, profile reconstruction, and parameter extraction.
• Improve measurement accuracy, precision, robustness, and computational efficiency.
• Create data fusion frameworks that leverage complementary information from multiple metrology sources such as CD-SAXS, XRD, and OCD etc.
• Develop and execute test plans to verify algorithm performance, reliability, and readiness for deployment in production environments.
• Collaborate with product and software engineering teams to transition research concepts into production-ready solutions.
• Publish technical papers, submit invention disclosures and patent applications

Qualifications

• Ph.D. or Master's degree in Physics, Applied Physics, Chemical Physics, Materials Science, Electrical Engineering, Mathematics and Statistics, Optics or a related field.
• Typically 3+ years (for Senior) or 7+ years (for Staff) of post-degree experience of R&D in the fields of algorithm development, physical modelling, scientific computing, machine learning, or semiconductor metrology experience; fewer years may be considered with exceptional technical depth and demonstrated impact.
• Deep understanding of the physics and instrumentation of advanced X-ray techniques, with hands-on experience in data analysis for CD-SAXS and XRD.
• Hands-on experience with forward simulation for CD-SAXS/XRD, solving inverse problems, physical parameter extraction, profile fitting, and multi-sensor data fusion techniques.
• Experience in one or more of the following areas: estimation and optimization, signal processing, statistics, and data visualization.
• Strong programming skills in Python / MATLAB / C++, or similar programming languages.
• Experience with machine learning libraries such as Scikit-learn and TensorFlow is highly desired.
• Proven R&D experience with developing and building data analysis and algorithm solutions with measurable outcomes, demonstrate strong analytical and scientific problem-solving skills, intellectual honesty and a sense of urgency in driving projects to completion.
• Excellent communication skills, ability to present technical materials both to working-level peers and to senior management internally and externally.
• Experience in the semiconductor or related manufacturing industry is strong plus, or demonstration of strong motivation and abilities to acquire semiconductor metrology domain knowledge on the job.
• Ability to travel up to 25% is preferred.
• Ability to work independently in a fast-paced, iterative development environment or work within a cross-department collaborative setting (R&D scientist, Applications, Software Development, Integration, ...).

Onto Innovation Inc. offers competitive salaries and a generous benefits package, including health/dental/vision/life/disability, PTO, 401K plan with employer match, and an Employee Stock Purchase Program (ESPP) along with health & wellness initiatives. We provide a collaborative working environment along with resources, and state-of-the-art tools & equipment to promote success; and a welcoming, inclusive corporate culture where individuals are recognized for their contributions.

Onto Innovation Inc. is an Equal Opportunity Employer and all qualified applicants will receive consideration for employment without regard to race, color, religion, gender, sexual orientation, national origin, genetic information, age, disability, veteran status, or any other legally protected basis.

For positions requiring access to technical data, Onto Innovation Inc., Inc. may have to obtain export licensing approval from the U.S. Department of Commerce- Bureau of Industry and Security and/or the U.S. Department of State- Directorate of Defense Trade Controls. As such, applicants for this position - except US Citizens, US Permanent Residents, and protected individuals as defined by 8 U.S.C. 1324b(a)(3) - may have to go through an export licensing review process.