Perrysburg, OH30+ days ago
Operate at the intersection of materials science, device physics, and pilot manufacturing engineering, acting as a technical leader in defining measurement strategies, correlating metrology data to performance and reliability, and resolving complex process-structure-property relationships. Design, develop, and deploy advanced inline, at-line, and offline metrology methods to monitor perovskite film formation, interfaces, microstructure, defects, and uniformity and their correlations with device performance and stability.