Possess technical knowledge of radiation effects in microelectronics and/or avionics systems, may include: basic mechanisms for single-event effects and total dose, test strategies, and mitigation techniques, and analysis of circuits and systemsBe familiar with the suite of activities known as Radiation Hardness Assurance (RHA) for avionics (analog, digital, power, etc.): determining Mission, Environment, Application, and Lifetime (MEAL) factors, developing and interpreting requirements, bill-of-materials requirement gap analysis, radiation testing, environment definition, radiation transport, shielding analysis, dose-depth curves, Single-Event Effects Criticality Analysis (SEECA), derating, Safe Operating Area (SOA), Radiation Design Margin (RDM), literature surveys, etc. Assess EEEE parts, circuits, functions, components, subsystems, and systems to evaluate risks, effectiveness of mitigation strategies, and the ability to meet functional, performance, safety, and reliability requirements during and after exposure to the mission ionizing radiation environmentLead or support screening and characterization test efforts for heavy ion, proton, and pulsed-laser Single-Event Effects (SEE), Total Ionizing Dose (TID), Enhanced Low-Dose Rate Sensitivity (ELDRS), Total Non Ionizing Dose (TNID), Displacement Damage Dose (DDD), etc.