Close visual acuity, with or without corrective lenses, required for activities including preparing and analyzing data; reading and interpreting figures; focusing and viewing microscopic images; visual inspection of small parts and defects; operating precision positioning probes; using measurement devices; and performing assembly or destructive analysis at close viewing distances. Perform and/or coordinate a broad range of advanced failure analysis techniques, including manual probing, electrical characterization, optical and infrared microscopy, thermal microscopy, focused ion beam (FIB) cross-sectioning, scanning electron microscopy (SEM), energy-dispersive X-ray spectroscopy (EDS), transmission electron microscopy (TEM), and fourier-transform infrared spectroscopy (FTIR).