Working under the direction of the Chief Technology Officer, the Test Engineer I will develop and maintain wafer-level and device-level test methods, define test conditions and acceptance criteria, support test-equipment selection and qualification, analyze electrical and product-performance data, and identify trends, anomalies, and potential failure mechanisms. This position supports research, customer-sponsored projects, prototype fabrication, product qualification, and low-volume semiconductor manufacturing by ensuring that fabricated devices are accurately characterized against defined technical, quality, and customer requirements.