PDN and cross-functional system debug: Drive PDN measurement and failure isolation across self-noise, coupling, rail droop/ripple, sequencing, package/board power delivery, SI/PI, optics, firmware, drivers, clocking, thermal, software workloads, and platform integration. Post-silicon bring-up and system validation: Lead bring-up, characterization, margining, shmoo, stress, compliance-readiness, and SW/HLOS-level validation across reference boards, optical modules, retimers, active/passive cables, and customer-like platforms.