Convert raw integration signals - CR fallout, BLT/SLT yield, SHTOL/CHTOL data, RMA trends, customer escalations - into decision-ready options that enable executive leadership to act with confidence on POR, QS/PS gates, and ramp-impacting risks. Resolve Vmin and binning escapes, performance shortfalls, and power anomalies by driving root-cause across design, methodology, DFT, ATE, package, software/firmware, and manufacturing - and own the WARs and productized fixes through to confirmation.