Onto Innovation is a leader in process control, combining global scale with an expanded portfolio of leading-edge technologies that include: 3D metrology spanning the chip from nanometer-scale transistors to micron-level die-interconnects; macro defect inspection of wafers and packages; metal interconnect composition; factory analytics; and lithography for advanced semiconductor packaging. Bachelor's degree in Electrical Engineering, Optical Engineering, Materials Science, Physics, Computer Engineering, Chemical Engineering, or a related technical discipline with 5+ years of experience in semiconductor inspection, metrology, applications engineering, process engineering, yield engineering, or related fields.