You will contribute to the hardware and software development of industry‑leading test solutions such as scan compression, hierarchical test access architectures, Logic Built-In-Self-Test (LBIST), Memory Built-In-Self-Test (MBIST), Power-On-Self-Test (POST), and In-System Test (IST). Strong knowledge of DFT requirements for SoCs, including scan, MBIST, LBIST, POST, IST, IJTAG, test access architecture, and design-for-testability tradeoffs.