Operate at the intersection of materials science, device physics, and pilot manufacturing engineering, acting as a technical leader in defining measurement strategies, correlating metrology data to performance and reliability, and resolving complex process‑structure‑property relationships. Design, develop, and deploy advanced inline, at‑line, and offline metrology methods to monitor perovskite film formation, interfaces, microstructure, defects, and uniformity and their correlations with device performance and stability.