Recognized expertise in advanced electron microscopy, including FIB, SEM, EDX/EDS, TEM/STEM, HRTEM, and electron diffraction, with deep hands-on experience in advanced FIB sample preparation such as plan-view TEM specimens and site-specific cross-sectional lamellae. Strong knowledge of semiconductor devices and manufacturing processes, preferably compound semiconductor lasers, including epitaxy, e-beam lithography, photolithography, wet and dry etching, PVD, CVD, metallization, and epitaxial regrowth.