Lead structured root cause analysis for materials-limited performance, yield, and reliability issues (film defects, interface failure, contamination, stoichiometry, stress, delamination); correlate process history with metrology (ellipsometry, lifetime, FTIR, SEM, I-V, and related methods) and drive corrective actions to first principles. Set your own priorities from program needs; execute multiple complex, multi-month materials projects in parallel (new film stacks, materials qualification, yield or reliability recovery, supplier materials) and come to leadership with solved problems and already-implemented solutions.